Stability of exfoliated Bi2Sr2DyxCa1−xCu2O8+ studied by Raman microscopy
نویسندگان
چکیده
Nearly nanometer-thick cuprates are an appealing platform for devices as well as exploring the roles of dimensionality, disorder, and free carrier density in these compounds. To this end we have produced exfoliated crystals of Bi2Sr2DyxCa1−xCu2O8+ on oxidized silicon substrates. The exfoliated crystals were characterized via atomic force and polarized Raman microscopies. Proper procedures for production, handling, and monitoring of these thin oxides are described. We observe a significant change in the effective exchange constant J of these exfoliated crystals.
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